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Bruker to Host Webinar on Small Molecule Characterization with Complete Molecular Confidence™ on October 28

(EMAILWIRE.COM, October 10, 2008 ) Worldwide - Bruker Corporation today announced an upcoming worldwide webinar October 28 to brief scientists on its new Complete Molecular Confidenceï¿½ NMR-LC/MS based integrated solution for on-the-fly molecular formulae determination and automated or interactive... more

Bruker Announces First Handheld XRF with Silicon Drift Detector

(EMAILWIRE.COM, September 08, 2008 ) Kennewick, WA- Bruker AXS Handheld Inc. announced a major technology breakthrough, its TRACERturboSD, the first handheld X-ray Fluorescence (XRF) instrument that uses a Silicon Drift Detector (SDD) for dramatically improved speed and sensitivity. Bruker's proprietary... more

Bruker to Present World’s First Handheld XRF to Have Silicon Drift Detector (SDD) at Stainless Steel World Conference in Texas

(EMAILWIRE.COM, August 26, 2008 ) KENNEWICK, Washington-- Bruker AXS today announced it will present its new TRACERturboSD (TM), the world’s first handheld X-ray Fluorescence (XRF) instrument with a Silicon Drift Detector (SDD), at the Stainless Steel World America Conference & Exhibition near Houston... more

Bruker AXS to Present Webinar Sept. 9th on Slag Analysis by XRF Spectrometry

(EMAILWIRE.COM, August 25, 2008 ) MADISON, Wisc.—Bruker AXS today announced that it will present a complimentary webinar September 9 on Slag Analysis by XRF Spectrometry. Slag is an important agent in high-temperature metallurgical processes. In batch processes using electric arc, ladle metallurgy... more

Bruker AXS to Present at 21st Congress of the International Union of Crystallography in Osaka, Japan

(EMAILWIRE.COM, August 22, 2008 ) MADISON, Wisc.--August 22, 2008—Bruker AXS today announced that it is participating in numerous events at the 21st Congress of the International Union of Crystallography opening August 23 at the Grand Cube Osaka. August 21 - Bruker KK Yokohama Workshop on... more

Bruker AXS Microanalysis Introduces Ultra-fast EBSD System, Next-Generation 123 eV Resolution EBSD System, Next-Generation 123 eV Resolution Analysis Software

(EMAILWIRE.COM, August 04, 2008 ) The innovative new QUANTAX CrystAlign TM system for SEM-based crystallographic analysis via electron backscatter diffraction (EBSD) consists of an ultra-fast EBSD detector and powerful, yet easy-to-use EBSD analysis software that is seamlessly integrated with Bruker’s... more

Bruker AXS Microanalysis Introduces New Ultra-High Energy Resolution XFlash® 5000 Silicon Drift Detector Series at M&M 2008

(EMAILWIRE.COM, August 03, 2008 ) The XFlash® 5010 is a 10 mm² detector that that provides superior light element performance. With 123 eV at Mn-Kalpha it offers an energy resolution of 46 eV at C Kalpha and 54 eV at F Kalpha. This allows for a peak resolution in the energy range below 1 keV that... more

Dr. Joseph Goldstein, Distinguished Professor, University of Massachusetts, Amherst , Wins 2008 Duncumb Award for Excellence in Microanalysis

(EMAILWIRE.COM, August 02, 2008 ) This year, Bruker is proud to announce that the Duncumb Award for Excellence in Microanalysis is awarded to Professor Joseph Goldstein of UMASS Amherst. Dr. Goldstein is a scientist, educator and administrator internationally known for his work in the development... more

Dr. Joseph Goldstein, Distinguished Professor, University of Massachusetts, Amherst , Wins 2008 Duncumb Award for Excellence in Microanalysis

(EMAILWIRE.COM, August 02, 2008 ) Albuquerque, NM - This year, Bruker is proud to announce that the Duncumb Award for Excellence in Microanalysis is awarded to Professor Joseph Goldstein of UMASS Amherst. Dr. Goldstein is a scientist, educator and administrator internationally known for his work... more

Bruker’s Innovative TRACERturboSD XRF Offers Unprecedented Specificity and Speed Critical to Analyzing Light Element Alloys Used in Metals Industries Like Die Casting

(EMAILWIRE.COM, July 21, 2008 ) KENNEWICK, Washington — July 21, 2008 - Bruker AXS announces another technology breakthrough for the die casting industry with the introduction of its new TRACERturboSD ™, the world’s first handheld X-ray Fluorescence (XRF) instrument that uses a Silicon Drift Detector... more

Bruker Announces Breakthrough in PMI Performance at Refineries with the World’s First Handheld XRF to Include Silicon Drift Detector (SDD)

(EMAILWIRE.COM, July 17, 2008 ) KENNEWICK, Washington — July 17, 2008 - Bruker AXS announces a technology breakthrough with the introduction of the new TRACERturboSD (TM), the world’s first handheld X-ray Fluorescence (XRF) instrument that uses a Silicon Drift Detector (SDD) for dramatically improved... more

Bruker AXS Announces Details of Gulf Coast Petrochemical Seminar July 17 in The Woodlands, Texas

(EMAILWIRE.COM, July 10, 2008 ) How will labs comply? As part of Bruker AXS’ commitment to foster professional advancement for analysts, improve proficiency, reduce cost and enhance quality, Bruker AXS invites you to attend its FREE Bruker Gulf Coast Petrochemical Seminar on Thursday, July 17,... more

Bruker AXS Announces Variable Counting Time for XRD - The Golden Standard for X-ray Data Collection

(EMAILWIRE.COM, July 03, 2008 ) Madison, Wisc.—July 3, 2008—Bruker AXS today announced XRDWizard V2.9 support for Variable Counting Time (VCT), a data collection scheme for X-ray powder diffraction, where the measurement time is systematically increased towards higher 2theta angles. As a result,... more

Bruker Announces Breakthrough in Aerospace Metals Analytical Performance with the World’s First Handheld XRF to Include Silicon Drift Detector (SDD)

(EMAILWIRE.COM, July 01, 2008 ) KENNEWICK, Washington — Bruker AXS announces a technology breakthrough with the introduction of the new TRACERturboSD (TM), the world’s first handheld X-ray Fluorescence (XRF) instrument that uses a Silicon Drift Detector (SDD) for dramatically improved speed, sensitivity... more

Bruker Announces Art and Archaeology Breakthrough in Analytical Performance with World’s First Handheld XRF to Use Silicon Drift Detector (SDD)

(EMAILWIRE.COM, June 30, 2008 ) KENNEWICK, Washington — June 30, 2008 - Bruker AXS today announced a technology breakthrough in art conservation and archaeology with the introduction of the new TRACERturboSD ™, the world’s first handheld X-ray Fluorescence (XRF) instrument that uses a Silicon Drift... more

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