(EMAILWIRE.COM, August 22, 2008 )

MADISON, Wisc.--August 22, 2008—Bruker AXS today announced that it is participating in numerous events at the 21st Congress of the International Union of Crystallography opening August 23 at the Grand Cube Osaka.

August 21 - Bruker KK Yokohama
Workshop on Diagnosis and Treatment of Problem Crystal Structures - Speakers include Dr. Charles F. Campana, Bruker AXS USA and Dr. Kenji Yoza, Bruker KK Yokohama

Sunday August 24 - Wednesday August 27
Daily 9:00 - 17:00 - Bruker AXS and Incoatec Exhibits

Sunday August 24
MS3 Room D-1003
10:00-10:30 MS.03.1 Rob W. W. Hooft: Reliable determination of absolute structure using small Bijvoet differences
Bruker Luncheon Seminar – Room C1001,2
12:45 – 13:30 Speakers include Roger Durst on New Detectors, Michael Ruf on Benchtop Systems, Daniel Frankel on Crystal Harvester, Arnt Kern on TOPAS for structure determination from powders, Carsten Michaelsen on Microfocus Sources, and Bram Schierbeek on MICROSTAR with latest optics
MS10 – Room D-1003
15:50 – 16:20 MS.10.3 Joerg Kaercher: True walk-away automation in chemical crystallography

Tuesday August 26
MS32 – Room C1001, 2
11:30 – 12:00 MS.32.4 Charles F. Campana: The application of a molecular replacement approach to the refinement of a copper nanoball complex
MS42 – Room E-1009
15:50 – 16:20 MS.42.3 B-C. Wang: Signal-based data collection: A novel approach to on-site auto-structure determination at SER-CAT

Wednesday August 27
MS44 – Room F-12CH
10:00 – 10:30 MS.44.1 M. Ruf: Is there a steep learning curve in crystallography?

Thursday August 28 – Friday August 29 - daily 12:30 - 14:45
Poster Sessions
P01.01.03(C171) Carsten Michaelsen: X-ray diffractometry with a microfocus source
et al: J. Wiesmann, B. Hasse, U. Preckwinkel, H. Cordes, N. Yang
P01.04.04(C171) Juergen Graf: Small X-ray beams for small crystals: Pushing the limits of home-lab X-ray sources. et al: C. Michaelsen, T. Schulz, D. Stalke, C. W. Lehmann, M. Ruf
P01.04.05(C172) Daniel C. Frankel: Optimizing signal-to-noise on a home X-ray source for the analysis of microcrystals. et al: R. Lancaster, B. Michell, A. Storm, R. Burkholder, F. Von Delft, J. Mirrer
P01.02.37(C182) Joerg Wiesmann: Total reflection and multilayer optics for synchrotrons and free-electron lasers. et al: F. Hertlein, C. Michaelsen, M.Stoermer
P01.11.88(C197) Bob B. He: Geometry and resolution of area detectors for X-ray powder diffraction

Saturday August 30
MS97 – Room B-05SH
14:20 – 14:50 MS.97.2 Roger D. Durst: High speed readout of microgap X-ray detectors

ABOUT BRUKER AXS: For more information about Bruker AXS and Bruker Corporation (NASDAQ: BRKR), please visit www.bruker-axs.com and www.bruker.com.

For Further Information:
Michael Willett
Public Relations Officer
Tel: +1 978-663-3660 ext. 1411
Email: Michael.Willett@bruker.com

Contact Information:
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Michael Willett
Tel: 978-663-3660
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